How do they test for surge immunity

Surge immunity testing is an important aspect of ensuring the reliability and performance of electronic devices. Surge events can cause transient voltage spikes that can damage or disrupt the operation of these devices. Therefore, it is crucial to test their immunity to surges to ensure their robustness.

Test equipment

Surge immunity testing involves subjecting the device under test (DUT) to a series of surges with different parameters. The equipment used for this testing includes a surge generator, which generates the high-energy pulses necessary for creating surge conditions. The generator consists of a high voltage source, energy storage capacitors, and switches to control the discharge process. It also incorporates voltage and current monitoring components to measure the characteristics of the surge events.

Testing standards

International Electrotechnical Commission (IEC) has defined several standards for surge immunity testing, such as IEC 61000-4-5. These standards specify the test levels and waveforms required to evaluate the surge immunity of different types of devices. They also define the test setups and procedures to ensure consistent and repeatable testing across various laboratories. Adhering to these standards allows manufacturers to assess and compare the surge immunity performance of their products effectively.

Testing procedure

The surge immunity testing procedure involves applying surge pulses of specific amplitude and duration to the DUT in a controlled environment. The DUT is connected to the surge generator through appropriate coupling devices. The surge events are typically applied both to the power supply lines and the signal/data lines of the device. The DUT's performance and behavior during and after the surge application are monitored and evaluated. This includes checking for any malfunctions, temporary disruptions, or permanent damages caused by the surge events. The test results are then compared against the specified pass/fail criteria defined by the relevant standards.